Gajjela, Raja Sekhar Reddy 
; Alzeidan, Ahmad ; Curbelo, Victor Manuel Orlando ; Quivy, Alain André ; koenraad, Paul M
Source: Physical Review Materials. Unidade: IF
Assunto: MICROSCOPIA DE FORÇA ATÔMICA
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GAJJELA, Raja Sekhar Reddy et al. Atomic-scale characterization of single and double layers of InAs and InAlAs Stranski-Krastanov quantum dots. Physical Review Materials, v. 6, 2022Tradução . . Disponível em: https://doi.org/10.1103/PhysRevMaterials.6.114604. Acesso em: 21 maio 2024.APA
Gajjela, R. S. R., Alzeidan, A., Curbelo, V. M. O., Quivy, A. A., & koenraad, P. M. (2022). Atomic-scale characterization of single and double layers of InAs and InAlAs Stranski-Krastanov quantum dots. Physical Review Materials, 6. doi:10.1103/PhysRevMaterials.6.114604NLM
Gajjela RSR, Alzeidan A, Curbelo VMO, Quivy AA, koenraad PM. Atomic-scale characterization of single and double layers of InAs and InAlAs Stranski-Krastanov quantum dots [Internet]. Physical Review Materials. 2022 ; 6[citado 2024 maio 21 ] Available from: https://doi.org/10.1103/PhysRevMaterials.6.114604Vancouver
Gajjela RSR, Alzeidan A, Curbelo VMO, Quivy AA, koenraad PM. Atomic-scale characterization of single and double layers of InAs and InAlAs Stranski-Krastanov quantum dots [Internet]. Physical Review Materials. 2022 ; 6[citado 2024 maio 21 ] Available from: https://doi.org/10.1103/PhysRevMaterials.6.114604
